Investigation of intermediate layer for Ag/Si metal-semiconductor contacts

The intermediate layer is a crucial component in thin film metal contacts. In determining Ohmic characteristics, selection of materials used as metal contact can affect device performance. However, in determine a good electrical conductor, it depends on their physical structure which is formed by mo...

Full description

Bibliographic Details
Main Author: Bahri, Bibi Zulaika
Format: Thesis
Language:English
English
English
Published: 2019
Subjects:
Online Access:http://eprints.uthm.edu.my/478/1/24p%20BIBI%20ZULAIKA%20BAHRI.pdf
http://eprints.uthm.edu.my/478/2/BIBI%20ZULAIKA%20COPYRIGHT%20DECLARATION.pdf
http://eprints.uthm.edu.my/478/3/BIBI%20ZULAIKA%20BHARI%20WATERMARK.pdf