Ensemble Classifier for Recognition of Small Variation in X-Bar Control Chart Patterns
Manufacturing processes have become highly accurate and precise in recent years, particularly in the chemical, aerospace, and electronics industries. This has attracted researchers to investigate improved procedures for monitoring and detection of small process variations to remain in line with such...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI
2023
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/8533/1/J15700_059e5b6d8fb9c3ee505a7faedffe6ac7.pdf |