Ensemble Classifier for Recognition of Small Variation in X-Bar Control Chart Patterns

Manufacturing processes have become highly accurate and precise in recent years, particularly in the chemical, aerospace, and electronics industries. This has attracted researchers to investigate improved procedures for monitoring and detection of small process variations to remain in line with such...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak: Alwan, Waseem, Ngadiman, Nor Hasrul Akhmal, Hassan, Adnan, Saufi, Syahril Ramadhan, Mahmood, Salwa
Formatua: Artikulua
Hizkuntza:English
Argitaratua: Mdpi 2023
Gaiak:
Sarrera elektronikoa:http://eprints.uthm.edu.my/9021/1/J15700_059e5b6d8fb9c3ee505a7faedffe6ac7.pdf