Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip

A high dopant concentration significantly reduces the peak current of the internal quantum efficiency (IQE) of the light-emitting diode (LED). The effect of the dopant concentration on the epitaxial layer toward the IQE, current density, and IQE droop of gallium nitride (GaN)-based LED chip is analy...

Full description

Bibliographic Details
Main Authors: Nazmi, Ahmad Nadzimuddin, Hairol Aman, Mohammad Amirul, Ahmad Fajri, Faris Azim, Ahmad Noorden, Ahmad Fakhrurrazi, Daud, Suzairi, Isa, Hafizah Noor
Format: Article
Published: Society of Photo-Optical Instrumentation Engineers (SPIE) 2023
Subjects:
_version_ 1811132263747813376
author Nazmi, Ahmad Nadzimuddin
Hairol Aman, Mohammad Amirul
Ahmad Fajri, Faris Azim
Ahmad Noorden, Ahmad Fakhrurrazi
Daud, Suzairi
Isa, Hafizah Noor
author_facet Nazmi, Ahmad Nadzimuddin
Hairol Aman, Mohammad Amirul
Ahmad Fajri, Faris Azim
Ahmad Noorden, Ahmad Fakhrurrazi
Daud, Suzairi
Isa, Hafizah Noor
author_sort Nazmi, Ahmad Nadzimuddin
collection ePrints
description A high dopant concentration significantly reduces the peak current of the internal quantum efficiency (IQE) of the light-emitting diode (LED). The effect of the dopant concentration on the epitaxial layer toward the IQE, current density, and IQE droop of gallium nitride (GaN)-based LED chip is analyzed with the doping variation from 1 × 1015 cm-3 to 1 × 1021 cm-3. The required current density for the dopant concentrations of 1 × 1015 cm-3 is 122.42 A / cm-2 with the IQE droop of 10%. Meanwhile, for the dopant concentrations of 1 × 1021 cm-3, the required current density for achieving peak IQE is 0.67 A / cm-2 with an IQE droop of 51%. The increase in dopant concentrations reduces the current density necessary for achieving peak IQE while increasing IQE droop. The optimization is performed for the device performances based on the peak current and IQE droop. The optimal dopant concentration for this GaN-based LED lies between 1 × 1017 cm-3 and 1 × 1018 cm-3, which is 4.47 × 1017 cm-3, with a peak IQE of 69.1%. The proposed epitaxy structure provides the optimal doping concentration for the homojunction LED chip with a compatible activation current. The results achieved in this work may benefit the entire optoelectronics field.
first_indexed 2024-09-24T00:00:32Z
format Article
id utm.eprints-106068
institution Universiti Teknologi Malaysia - ePrints
last_indexed 2024-09-24T00:00:32Z
publishDate 2023
publisher Society of Photo-Optical Instrumentation Engineers (SPIE)
record_format dspace
spelling utm.eprints-1060682024-06-06T08:11:40Z http://eprints.utm.my/106068/ Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip Nazmi, Ahmad Nadzimuddin Hairol Aman, Mohammad Amirul Ahmad Fajri, Faris Azim Ahmad Noorden, Ahmad Fakhrurrazi Daud, Suzairi Isa, Hafizah Noor QC Physics A high dopant concentration significantly reduces the peak current of the internal quantum efficiency (IQE) of the light-emitting diode (LED). The effect of the dopant concentration on the epitaxial layer toward the IQE, current density, and IQE droop of gallium nitride (GaN)-based LED chip is analyzed with the doping variation from 1 × 1015 cm-3 to 1 × 1021 cm-3. The required current density for the dopant concentrations of 1 × 1015 cm-3 is 122.42 A / cm-2 with the IQE droop of 10%. Meanwhile, for the dopant concentrations of 1 × 1021 cm-3, the required current density for achieving peak IQE is 0.67 A / cm-2 with an IQE droop of 51%. The increase in dopant concentrations reduces the current density necessary for achieving peak IQE while increasing IQE droop. The optimization is performed for the device performances based on the peak current and IQE droop. The optimal dopant concentration for this GaN-based LED lies between 1 × 1017 cm-3 and 1 × 1018 cm-3, which is 4.47 × 1017 cm-3, with a peak IQE of 69.1%. The proposed epitaxy structure provides the optimal doping concentration for the homojunction LED chip with a compatible activation current. The results achieved in this work may benefit the entire optoelectronics field. Society of Photo-Optical Instrumentation Engineers (SPIE) 2023-07 Article PeerReviewed Nazmi, Ahmad Nadzimuddin and Hairol Aman, Mohammad Amirul and Ahmad Fajri, Faris Azim and Ahmad Noorden, Ahmad Fakhrurrazi and Daud, Suzairi and Isa, Hafizah Noor (2023) Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip. Optical Engineering, 62 (7). NA. ISSN 0091-3286 http://dx.doi.org/10.1117/1.OE.62.7.077104 DOI:10.1117/1.OE.62.7.077104
spellingShingle QC Physics
Nazmi, Ahmad Nadzimuddin
Hairol Aman, Mohammad Amirul
Ahmad Fajri, Faris Azim
Ahmad Noorden, Ahmad Fakhrurrazi
Daud, Suzairi
Isa, Hafizah Noor
Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip
title Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip
title_full Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip
title_fullStr Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip
title_full_unstemmed Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip
title_short Dopant concentrations analysis on electro-optic performances of gallium nitride-based ultraviolet light-emitting diode chip
title_sort dopant concentrations analysis on electro optic performances of gallium nitride based ultraviolet light emitting diode chip
topic QC Physics
work_keys_str_mv AT nazmiahmadnadzimuddin dopantconcentrationsanalysisonelectroopticperformancesofgalliumnitridebasedultravioletlightemittingdiodechip
AT hairolamanmohammadamirul dopantconcentrationsanalysisonelectroopticperformancesofgalliumnitridebasedultravioletlightemittingdiodechip
AT ahmadfajrifarisazim dopantconcentrationsanalysisonelectroopticperformancesofgalliumnitridebasedultravioletlightemittingdiodechip
AT ahmadnoordenahmadfakhrurrazi dopantconcentrationsanalysisonelectroopticperformancesofgalliumnitridebasedultravioletlightemittingdiodechip
AT daudsuzairi dopantconcentrationsanalysisonelectroopticperformancesofgalliumnitridebasedultravioletlightemittingdiodechip
AT isahafizahnoor dopantconcentrationsanalysisonelectroopticperformancesofgalliumnitridebasedultravioletlightemittingdiodechip