NBTI defects characterization using energy profiling simulation technique
A numerical simulation framework to simulate the positive charges based on location of energy levels is conducted in this work. This framework utilizes an energy profiling approach, where the behavior of hole traps under stress conditions is studied. In this process, a recovery voltage is applied to...
| Main Authors: | , , , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2023
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| Subjects: |