Modulation transfer function (MTF) and noise power spectrum (NPS) studies on three industrial digital radiography (IDR) systems
Two main spatial frequency and quantitative calculations and measurements am, used to study the imaging system of three industrial digital radiography (IDR) modules for non-destructive testing (NDT), namely complementary metal oxide semiconductor (CMOS) flat-panel digital detector with 50 mu m pixel...
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British Inst Non-Destructive Testing
2009
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