Modulation transfer function (MTF) and noise power spectrum (NPS) studies on three industrial digital radiography (IDR) systems

Modulation transfer function (MTF) and noise power spectrum (NPS) studies on three industrial digital radiography (IDR) systems

Two main spatial frequency and quantitative calculations and measurements am, used to study the imaging system of three industrial digital radiography (IDR) modules for non-destructive testing (NDT), namely complementary metal oxide semiconductor (CMOS) flat-panel digital detector with 50 mu m pixel...

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Bibliographic Details
Main Authors:	Mohd. Salleh, K. A., Hamzah, A. R., Wan Hassan, W. M. S.
Format:	Article
Published:	British Inst Non-Destructive Testing 2009
Subjects:	TK Electrical engineering. Electronics Nuclear engineering

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