Electrical conductivity measurements in evaporated tin sulphide thin films
Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...
| Hlavní autoři: | , , , , |
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| Médium: | Článek |
| Jazyk: | English |
| Vydáno: |
Taylor & Francis
1994
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| Témata: | |
| On-line přístup: | http://eprints.utm.my/2620/1/international_jurnal_of_electronic.pdf |