Study on test compaction in high-level Automatic Test Pattern Generation (ATPG) platform

Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects cau...

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Bibliographic Details
Main Authors: Chin, Ayub Abdullah, Ooi, Chia Yee
Format: Article
Published: 2013
Subjects: