Characterization of planar and vertical n-channel mosfet in nanometer regime

In recent years, there is more and more design on MOSFET that has been developed to fulfill the market need. This project focused on the comparison of planar and vertical n-channel MOS transistor characteristic with effective channel length of 100nm down to 50nm. Planar and vertical n-channel MOS tr...

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Detalhes bibliográficos
Autor principal: Sulaiman, Ima
Formato: Tese
Idioma:English
Publicado em: 2007
Assuntos:
Acesso em linha:http://eprints.utm.my/6389/1/ImaSulaimanMFKE2007.pdf