X-ray diffraction study of evaporated cadmium telluride thin films
X-ray diffraction measurement was performed on evaporated CdTe thin films indicating a preferential orientation in (111) direction. The effect of the deposition rate, thickness and substrate temperature was investigated and the film quality was discussed. It was found that as the deposition rate was...
| Główni autorzy: | , , |
|---|---|
| Format: | Artykuł |
| Język: | English |
| Wydane: |
Faculty of Science
2009
|
| Hasła przedmiotowe: | |
| Dostęp online: | http://eprints.utm.my/744/1/BBIsmailDeraman2009_XRayDiffractionStudyofEvaporated.pdf |