Study on threshold voltage shifts and reliability in PFETs by high-voltage on-state and off-state stress
In recent decades, electronics have made much progress thanks to the scaling of silicon complementary metal-oxide-semiconductor (CMOS) very-large-scale integration (VLSI). Now, dimensions of state-of-the-art metal-oxide-semiconductor field effect transistors (MOSFETs) are as small as tens of nanomet...
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2013
|
| Subjects: | |
| Online Access: | http://eprints.utm.my/78380/1/NurulEzailaAliasPFS2013.pdf |