Defect detection in thermal image using thresholding technique
This paper proposes a technique to detect defects as depicted in a thermal image. The technique is based on a local neighborhood pixel operation using kernel window 3x3. All pixels within this window will be mapped to only a single pixel value. Next, the thresholding technique is used. The main focu...
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| Format: | Conference or Workshop Item |
| Published: |
2007
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| Subjects: |