Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes

Single and double layer In0.5Ga0.5As/GaAs QDs with various buffer layer thickness were grown by metal-organic chemical vapor deposition (MOCVD) using Stranski-Krastanow growth mode. The effect of buffer layer thickness on a high density QDs has been investigated using atomic force microscopy (AFM)....

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: Aryanto, Didik, Othaman, Zulkafli, Ismail, Abd. Khamim, Muhammad, Rosnita, Saryati, Amira
Формат: Book Section
Хэвлэсэн: Faculty of Science, Universiti Teknologi Malaysia 2009
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