Adaptive random testing with total cartesian distance for black box circuit under test
Testing and verification of digital circuits is of vital importance in electronics industry. Moreover, key designs require preservation of their intellectual property that might restrict access to the internal structure of circuit under test. Random testing is a classical solution to black box testi...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Institute of Advanced Engineering and Science
2020
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| Subjects: | |
| Online Access: | http://eprints.utm.my/90887/1/AbuKhariA%27ain2020_AdaptiveRandomTestingwithTotalCartesianDistance.pdf |