Reliability analysis of junctionless fin field effect transistor (JL-FinFET)
When scaling down of transistors reaches below 20nm, the reliability of a device becomes more important due to the device’s needs to sustain its performance while also being able to endure reliability degradation effects. Junctionless Fin Field Effect Transistor (JL-FinFET) provides a solution for c...
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Format: | Thesis |
Language: | English |
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2022
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Online Access: | http://eprints.utm.my/99542/1/MuhammadNaziiruddinHamzahMSKE2022.pdf |