Strain measurement using electron back scatter diffraction

Gelijkaardige items

• Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
  door: Wilkinson, A
  Gepubliceerd in: (1996)
• Mapping strains at the nanoscale using electron back scatter diffraction
  door: Wilkinson, A, et al.
  Gepubliceerd in: (2009)
• Measurement of small misorientations using electron back scatter diffraction
  door: Wilkinson, A
  Gepubliceerd in: (1999)
• Strain tensor mapping at the nanoscale using electron back scatter diffraction
  door: Wilkinson, A, et al.
  Gepubliceerd in: (2006)
• Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
  door: Wilkinson, A
  Gepubliceerd in: (2011)