Strain measurement using electron back scatter diffraction
Κύριος συγγραφέας: | Wilkinson, A |
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Μορφή: | Conference item |
Έκδοση: |
1998
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Παρόμοια τεκμήρια
Παρόμοια τεκμήρια
-
Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
ανά: Wilkinson, A
Έκδοση: (1996) -
Mapping strains at the nanoscale using electron back scatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2009) -
Measurement of small misorientations using electron back scatter diffraction
ανά: Wilkinson, A
Έκδοση: (1999) -
Strain tensor mapping at the nanoscale using electron back scatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2006) -
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
ανά: Wilkinson, A
Έκδοση: (2011)