Strain measurement using electron back scatter diffraction
المؤلف الرئيسي: | Wilkinson, A |
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التنسيق: | Conference item |
منشور في: |
1998
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مواد مشابهة
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Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
حسب: Wilkinson, A
منشور في: (1996) -
Mapping strains at the nanoscale using electron back scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2009) -
Measurement of small misorientations using electron back scatter diffraction
حسب: Wilkinson, A
منشور في: (1999) -
Strain tensor mapping at the nanoscale using electron back scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2006) -
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
حسب: Wilkinson, A
منشور في: (2011)