Strain measurement using electron back scatter diffraction
Үндсэн зохиолч: | Wilkinson, A |
---|---|
Формат: | Conference item |
Хэвлэсэн: |
1998
|
Ижил төстэй зүйлс
Ижил төстэй зүйлс
-
Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
-н: Wilkinson, A
Хэвлэсэн: (1996) -
Mapping strains at the nanoscale using electron back scatter diffraction
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2009) -
Measurement of small misorientations using electron back scatter diffraction
-н: Wilkinson, A
Хэвлэсэн: (1999) -
Strain tensor mapping at the nanoscale using electron back scatter diffraction
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2006) -
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
-н: Wilkinson, A
Хэвлэсэн: (2011)