Applications of deep learning in electron microscopy

We review the growing use of machine learning in electron microscopy (EM) driven in part by the availability of fast detectors operating at kiloHertz frame rates leading to large data sets that cannot be processed using manually implemented algorithms. We summarize the various network architectures...

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Detalhes bibliográficos
Principais autores: Treder, KP, Huang, C, Kim, JS, Kirkland, AI
Formato: Journal article
Idioma:English
Publicado em: Oxford University Press 2022