Magnetic ordering in Cr-doped Bi₂Se₃ thin films
We report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. Highresolution XRD shows the exceptionally...
| Hlavní autoři: | , , , , , , , , , , , , , |
|---|---|
| Médium: | Journal article |
| Jazyk: | English |
| Vydáno: |
European Physical Society
2014
|