Real-space Measurements of Bonding Charge Density in Aberration-corrected HREM
Egile Nagusiak: | Ciston, J, Haigh, S, Kim, J, Kirkland, A, Marks, L |
---|---|
Formatua: | Journal article |
Argitaratua: |
2009
|
Antzeko izenburuak
-
Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
nork: Ciston, J, et al.
Argitaratua: (2009) -
Optimized conditions for imaging the effects of bonding charge density in electron microscopy.
nork: Ciston, J, et al.
Argitaratua: (2011) -
Aberration-corrected HREM/STEM for semiconductor research
nork: Hetherington, C, et al.
Argitaratua: (2005) -
A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
nork: Hutchison, J, et al.
Argitaratua: (2005) -
Aberration-Corrected Imaging in CTEM
nork: Haigh, S, et al.
Argitaratua: (2011)