Microstructural characterisation of novel nitride nanostructures using electron microscopy

Microstructural characterisation of novel nitride nanostructures using electron microscopy

<p>Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth...

Descripció completa

Dades bibliogràfiques
Autor principal:	Severs, J
Altres autors:	Nellist, P
Format:	Thesis
Idioma:	English
Publicat:	2014
Matèries:	Nanostructures Atomic scale structure and properties Advanced materials Microscopy Materials Sciences Optoelectronics Microscopy and microanalysis High resolution microscopy Electron image analysis Semiconductors

Ítems similars

Microstructural properties of semiconductor nanostructures
per: Li, F
Publicat: (2011)

Synthesis and characterisation of large area graphene
per: Robertson, A, et al.
Publicat: (2013)

Atomic scale characterisation of oxide dispersion strengthened steels for fusion applications
per: Williams, C, et al.
Publicat: (2012)

Dynamics of nanostructured light emitted diodes
per: Chan, CCS
Publicat: (2014)

Electron energy loss spectroscopy of fullerene materials
per: Nicholls, R
Publicat: (2006)

Key events in the history of electron microscopy
per: Haguenau, F, et al.
Publicat: (2003)

Quantitative structural and compositional characterisation of bimetallic fuel-cell catalyst nanoparticles using STEM
per: MacArthur, K, et al.
Publicat: (2015)

The irradiation resistance of oxide dispersion strengthened steels
per: Burrows, C
Publicat: (2015)

Processing and properties of aligned carbon nanotube/glass ceramic composite
per: Otieno, G
Publicat: (2012)

Defect characterisation in multi-crystalline silicon
per: Lotharukpong, C
Publicat: (2015)

Understanding the mechanisms of stress corrosion cracking
per: Kruska, K
Publicat: (2012)

High resolution secondary ion mass spectrometry analysis of trace elements in cereal grain and roots
per: Moore, K
Publicat: (2011)

Study of early-stage precipitation in Al-Mg-Si(-Cu) alloys by 3D atom probe
per: Zandbergen, MW
Publicat: (2008)

Residual stress distribution in a functionally graded alumina-silicon carbide material
per: Dancer, C, et al.
Publicat: (2012)

Probing the deformation of ductile polycrystals by synchrotron x-ray micro-diffraction
per: Hofmann, F, et al.
Publicat: (2011)

Chemical vapour deposition growth of large-area graphene on metals
per: Murdock, AT
Publicat: (2014)

Quantitative analysis of core-shell nanoparticle catalysts by scanning transmission electron microscopy
per: E, H
Publicat: (2013)

Learning motifs and their hierarchies in atomic resolution microscopy
per: Dan, Jiadong, et al.
Publicat: (2023)

Electron microscopy study of radiation damage in tungsten and alloys
per: Yi, X
Publicat: (2014)

Powder processing of oxide dispersion strengthened steels for nuclear applications
per: Gorley, M
Publicat: (2014)

Features of the nanostructure formation in the Nd-Pr-Fe-B-system alloys: a study by AFM and MFM
per: Tereshina Irina, et al.
Publicat: (2022-06-01)

Advanced electron microscopy and nanomaterials : selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) Mx̌ico, September 29th-October 2nd, 2009 /
per: Advanced Electron Microscopy School for Nanomaterials (1st : 2009 : Saltillo (Coahuila) Mx̌ico), et al.
Publicat: (c201)

Scanning electron microscopy and x-ray microanalysis /
per: Goldstein, Joseph, 1939-
Publicat: (2003)

Study of oxidation mechanisms of zirconium alloys by electron microscopy
per: Ni, N
Publicat: (2011)

Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy
per: Oku Takeo
Publicat: (2012-10-01)

Scanning electron microscopy and x-ray microanalysis [compact disc] /
per: Goldstein, Joseph, 1939-
Publicat: (2003)

Experimental Nanomechanics. Atomic Force Microscopy Methods
per: S.A. Chizhik
Publicat: (2008-03-01)

Scanning electron microscopy and x-ray microanalysis /
per: 371604 Lee, Robert Edward
Publicat: (1993)

Sims Characterisation of ZnO Layer Prepared By Pulsed Laser Deposition
per: Andrej Vincze, et al.
Publicat: (2005-01-01)

Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material
per: Qilong Cheng, et al.
Publicat: (2024-06-01)

The use of scanning electron microscopy and an electron microprobe in studies on oxidation of sulfur compounds by bacteria and bioleaching of heavy metals /
per: 449103 Ostrowski, Marek, et al.

Scanning electron microscopy and x-ray microanalysis : a text for biologists materials scientists, and geologist/
per: Goldstein, Joseph I.
Publicat: (1992)

Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
per: Lulu Zhou, et al.
Publicat: (2017-04-01)

'Hybrid' non-destructive imaging techniques for engineering materials applications
per: Baimpas, N
Publicat: (2014)

The self-assembly of nucleic acid bases on metal and mineral surfaces
per: Shvarova, O, et al.
Publicat: (2011)

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics
per: Bartlomiej Lechowski, et al.
Publicat: (2024-01-01)

Development of Al alloy composites by powder metallurgy routes
per: Jiang, X
Publicat: (2014)

Reactive hydride composites for efficient hydrogen energy storage
per: Nwakwuo, C
Publicat: (2011)

Measuring and understanding grain boundary properties of engineering ceramics
per: Norton, A, et al.
Publicat: (2013)

THE EFFECTS OF ANNEALING ON MICROSTRUCTURAL CHANGES FOR ALUMINIUM NITRIDE EPITAXIAL GROWN ON SAPPHIRE BY TRANSMISSION ELECTRON MICROSCOPY /lcJESBAINS KAUR
per: Jesbains Kaur, 1983-, author, et al.
Publicat: (2017)