Microstructural characterisation of novel nitride nanostructures using electron microscopy

Microstructural characterisation of novel nitride nanostructures using electron microscopy

<p>Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth...

书目详细资料
主要作者:	Severs, J
其他作者:	Nellist, P
格式:	Thesis
语言:	English
出版:	2014
主题:	Nanostructures Atomic scale structure and properties Advanced materials Microscopy Materials Sciences Optoelectronics Microscopy and microanalysis High resolution microscopy Electron image analysis Semiconductors

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