Managing dose-, damage- and data-rates in multi-frame spectrum-imaging
As an instrument, the scanning transmission electron microscope is unique in being able to simultaneously explore both local structural and chemical variations in materials at the atomic scale. This is made possible as both types of data are acquired serially, originating simultaneously from sample...
Үндсэн зохиолчид: | Jones, L, Varambhia, A, Beanland, R, Kepaptsoglou, D, Griffiths, I, Ishizuka, A, Azough, F, Freer, R, Ishizuka, K, Cherns, D, Ramasse, Q, Lozano-Perez, S, Nellist, P |
---|---|
Формат: | Journal article |
Хэвлэсэн: |
Oxford University Press
2018
|
Ижил төстэй зүйлс
Ижил төстэй зүйлс
-
Towards atomic-resolution electron energy loss spectroscopy in an uncorrected 30kV scanning electron microscope
-н: Ramasse Quentin, зэрэг
Хэвлэсэн: (2024-01-01) -
Phonon spectroscopy at atomic resolution
-н: Hage, F, зэрэг
Хэвлэсэн: (2019) -
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM
-н: Varambhia, A, зэрэг
Хэвлэсэн: (2018) -
Van der Waals epitaxy between the highly lattice mismatched Cu doped FeSe and Bi₂Te₃
-н: Ghasemi, A, зэрэг
Хэвлэсэн: (2017) -
Robust theoretical modelling of core ionisation edges for quantitative electron energy loss spectroscopy of B- and N-doped graphene.
-н: Hardcastle, T, зэрэг
Хэвлэсэн: (2017)