Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

مواد مشابهة

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  حسب: Song, X, وآخرون
  منشور في: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  حسب: Song, X, وآخرون
  منشور في: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  حسب: Sebastiani, M, وآخرون
  منشور في: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  حسب: Sebastiani, M, وآخرون
  منشور في: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  حسب: Korsunsky, A, وآخرون
  منشور في: (2009)