Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Show other versions (1)
Detalles Bibliográficos
Main Authors: Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A
Formato: Journal article
Publicado: 2012
Descripción
Summary:

Títulos similares