Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
Aberration correction leads to reduced focal depth of field in the electron microscope. This reduced depth of field can be exploited to probe specific depths within a sample, a process known as optical sectioning. An electron microscope fitted with aberration correctors for both the pre- and postspe...
| Egile Nagusiak: | , , , |
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| Formatua: | Conference item |
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2008
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