Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes

Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the obj...

সম্পূর্ণ বিবরণ

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Kirkland, A, Meyer, MR, Sloan, J, Hutchison, J
বিন্যাস: Conference item
প্রকাশিত: 2005