ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

Παρόμοια τεκμήρια

• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  ανά: Czernuszka, J, κ.ά.
  Έκδοση: (1991)
• ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
  ανά: Wilkinson, A, κ.ά.
  Έκδοση: (1993)
• ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
  ανά: Czernuszka, J, κ.ά.
  Έκδοση: (1991)
• ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
  ανά: Wilkinson, A, κ.ά.
  Έκδοση: (1993)
• Effects of surface relaxation on electron channelling contrast images of misfit dislocations
  ανά: Wilkinson, A, κ.ά.
  Έκδοση: (1994)