Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...
Prif Awdur: | Wilkinson, A |
---|---|
Fformat: | Journal article |
Iaith: | English |
Cyhoeddwyd: |
1996
|
Eitemau Tebyg
-
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
gan: Wilkinson, A
Cyhoeddwyd: (2011) -
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2011) -
Strain measurement using electron back scatter diffraction
gan: Wilkinson, A
Cyhoeddwyd: (1998) -
Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
gan: Britton, T, et al.
Cyhoeddwyd: (2011) -
Measurement of small misorientations using electron back scatter diffraction
gan: Wilkinson, A
Cyhoeddwyd: (1999)