$Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.$

Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.

A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...

書誌詳細
第一著者:	Wilkinson, A
フォーマット:	Journal article
言語:	English
出版事項:	1996

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