The properties of nitrogen and oxygen in silicon

A novel dislocation locking technique is used to study the behaviour of nitrogen and oxygen in silicon. Specimens containing well-defined arrays of dislocation half-loops are subjected to isothermal anneals of controlled duration, during which nitrogen or oxygen diffuses to the dislocations. The str...

ver descrição completa

Detalhes bibliográficos
Principais autores: Murphy, J, John Douglas Murphy
Outros Autores: Wilshaw, P
Formato: Tese
Idioma:English
Publicado em: 2006
Assuntos: