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Electron channeling and ion ch...
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Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:
Trager-Cowan, C
,
Edwards, P
,
Dynowski, F
,
Sweeney, F
,
Wilkinson, A
,
Winkelmann, A
,
Day, A
,
Wang, T
,
Parbrook, P
,
Watson, I
,
Joy, D
Formáid:
Journal article
Foilsithe / Cruthaithe:
2008
Stoc
Cur síos
Míreanna comhchosúla
Amharc foirne
Míreanna comhchosúla
Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
de réir: Trager-Cowan, C, et al.
Foilsithe / Cruthaithe: (2007)
Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
de réir: Trager-Cowan, C, et al.
Foilsithe / Cruthaithe: (2006)
Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
de réir: Trager-Cowan, C, et al.
Foilsithe / Cruthaithe: (2006)
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.
de réir: Naresh-Kumar, G, et al.
Foilsithe / Cruthaithe: (2012)
Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
de réir: Wilkinson, A, et al.
Foilsithe / Cruthaithe: (2016)