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  • Electron channeling and ion ch...
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Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí: Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D
Formáid: Journal article
Foilsithe / Cruthaithe: 2008
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Míreanna comhchosúla

  • Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
    de réir: Trager-Cowan, C, et al.
    Foilsithe / Cruthaithe: (2007)
  • Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
    de réir: Trager-Cowan, C, et al.
    Foilsithe / Cruthaithe: (2006)
  • Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
    de réir: Trager-Cowan, C, et al.
    Foilsithe / Cruthaithe: (2006)
  • Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.
    de réir: Naresh-Kumar, G, et al.
    Foilsithe / Cruthaithe: (2012)
  • Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
    de réir: Wilkinson, A, et al.
    Foilsithe / Cruthaithe: (2016)

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