Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Ижил төстэй зүйлс

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  -н: Trager-Cowan, C, зэрэг
  Хэвлэсэн: (2006)
• Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
  -н: Trager-Cowan, C, зэрэг
  Хэвлэсэн: (2006)
• Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.
  -н: Naresh-Kumar, G, зэрэг
  Хэвлэсэн: (2012)
• Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
  -н: Wilkinson, A, зэрэг
  Хэвлэсэн: (2016)