Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Схожие документы

• Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
  по: Trager-Cowan, C, и др.
  Опубликовано: (2007)
• Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
  по: Trager-Cowan, C, и др.
  Опубликовано: (2006)
• Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
  по: Trager-Cowan, C, и др.
  Опубликовано: (2006)
• Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.
  по: Naresh-Kumar, G, и др.
  Опубликовано: (2012)
• Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
  по: Wilkinson, A, и др.
  Опубликовано: (2016)