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Electronic structure at realis...
Čujuhandieđut
Deakstadieđáhus
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Doalvun: RefWorks
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Bissovaš liŋka
Electronic structure at realistic Si(100)-SiO2 interfaces
Bibliográfalaš dieđut
Váldodahkkit:
Giustino, F
,
Bongiorno, A
,
Pasquarello, A
Materiálatiipa:
Conference item
Almmustuhtton:
2004
Oažžasuvvandieđut
Govvádus
Geahča maid
Bargiidšearbma
Geahča maid
Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
Dahkki: Giustino, F, et al.
Almmustuhtton: (2005)
Atomic-scale modelling of the Si(100)-SiO(2) interface
Dahkki: Giustino, F, et al.
Almmustuhtton: (2005)
Proton-induced fixed positive charge at the Si(100)-SiO2 interface.
Dahkki: Godet, J, et al.
Almmustuhtton: (2007)
Modeling of Si 2p core-level shifts at Si-(ZrO(2))(x)(SiO(2))(1-x) interfaces
Dahkki: Giustino, F, et al.
Almmustuhtton: (2002)
Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
Dahkki: Giustino, F, et al.
Almmustuhtton: (2005)