EFFECTS OF HIGH UNIAXIAL STRESS ON FAR INFRA-RED IMPURITY SPECTRA OF HIGH-PURITY NORMAL-TYPE AND PARA-TYPE SILICON

Xehetasun bibliografikoak
Egile Nagusiak: Cooke, R, Nicholas, R, Stradling, R, Portal, J, Askenazy, S
Formatua: Journal article
Argitaratua: 1978