EFFECTS OF HIGH UNIAXIAL STRESS ON FAR INFRA-RED IMPURITY SPECTRA OF HIGH-PURITY NORMAL-TYPE AND PARA-TYPE SILICON

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí: Cooke, R, Nicholas, R, Stradling, R, Portal, J, Askenazy, S
Formáid: Journal article
Foilsithe / Cruthaithe: 1978