185978 Backenstoss, G. Evaluation of the surface concentration of diffused layers in silicon.
Chicago-čujuhus (17. p.)185978 Backenstoss, Gerhard. Evaluation of the Surface Concentration of Diffused Layers in Silicon.
MLA-čujuhus (9. p.)185978 Backenstoss, Gerhard. Evaluation of the Surface Concentration of Diffused Layers in Silicon.
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