High current density 1.2 kV class HfO2-gated vertical GaN trench MOSFETs

This work reports on high current density 1.2 kV class HfO _2 -gated vertical GaN trench metal-oxide-semiconductor field-effect transistors (MOSFETs). An output current density of 330 mA mm ^−1 is reported at a drain bias of five volts, which, to our knowledge, is over ten-times the highest reported...

Descrición completa

Detalles Bibliográficos
Main Authors: Andrew T. Binder, Jeffrey Steinfeldt, Kevin J. Reilly, Richard S. Floyd, Peter T. Dickens, Joseph P. Klesko, Andrew A. Allerman, Robert J. Kaplar
Formato: Artigo
Idioma:English
Publicado: IOP Publishing 2024-01-01
Series:Applied Physics Express
Subjects:
Acceso en liña:https://doi.org/10.35848/1882-0786/ad85c1